TY  - RPRT
TI  - Elimination of basal-plane stacking faults in semipolar/nonpolar GaN and light emitting diodes heteroepitaxially grown on sapphire substrates
AU  - Jie Song
AU  - Joowon Choi
AU  - Cheng Zhang
AU  - Zhen Deng
AU  - Yujun Xie
AU  - Jung Han
PY  - 2018
UR  - https://arxiv.org/abs/1810.06794
ID  - 1810.06794
ER  -