@misc{indiciae7458edabd7b2,
  title = {Structural stability and energy levels of carbon-related defects in amorphous SiO\$\_2\$ and its interface with SiC},
  author = {Yu-ichiro Matsushita and Atsushi Oshiyama},
  year = {2018},
  doi = {10.7567/jjap.57.125701},
  url = {https://arxiv.org/abs/1810.09097},
  note = {Source identifier: 1810.09097}
}