TY  - RPRT
TI  - Structural stability and energy levels of carbon-related defects in amorphous SiO$_2$ and its interface with SiC
AU  - Yu-ichiro Matsushita
AU  - Atsushi Oshiyama
PY  - 2018
DO  - 10.7567/jjap.57.125701
UR  - https://arxiv.org/abs/1810.09097
ID  - 1810.09097
ER  -