@misc{indiciaefa0de56c1c36,
  title = {Proton Radiation Damage Experiment for X-Ray SOI Pixel Detectors},
  author = {Keigo Yarita and Takayoshi Kohmura and Kouichi Hagino and Taku Kogiso and Kenji Oono and Kousuke Negishi and Koki Tamasawa and Akinori Sasaki and Satoshi Yoshiki and Takeshi Go Tsuru and Takaaki Tanaka and Hideaki Matsumura and Katsuhiro Tachibana and Hideki Hayashi and Sodai Harada and Ayaki Takeda and Koji Mori and Yusuke Nishioka and Nobuaki Takebayashi and Shoma Yokoyama and Kohei Fukuda and Yasuo Arai and Toshinobu Miyoshi and Ikuo Kurachi and Tsuyoshi Hamano and the SOIPIX group},
  year = {2018},
  doi = {10.1016/j.nima.2018.09.057},
  url = {https://arxiv.org/abs/1810.09193},
  note = {Source identifier: 1810.09193}
}