@misc{indiciaefc29bd1ca726,
  title = {Supervised Classification Methods for Flash X-ray single particle diffraction Imaging},
  author = {Jing Liu and Gijs van der Schot and Stefan Engblom},
  year = {2018},
  doi = {10.1364/oe.27.003884},
  url = {https://arxiv.org/abs/1810.10786},
  note = {Source identifier: 1810.10786}
}