@misc{indiciaed977bbcfc21b,
  title = {Coherent X-ray measurement of step-flow propagation during growth on polycrystalline thin film surfaces},
  author = {Randall L. Headrick and Jeffrey G. Ulbrandt and Peco Myint and Jing Wan and Yang Li and Andrei Fluerasu and Yugang Zhang and Lutz Wiegart and Karl F. Ludwig, Jr},
  year = {2019},
  doi = {10.1038/s41467-019-10629-8},
  url = {https://arxiv.org/abs/1810.11585},
  note = {Source identifier: 1810.11585}
}