TY  - RPRT
TI  - Electron Monte Carlo Simulations of Nanoporous Si Thin Films -- The Influence of Pore-Edge Charges
AU  - Qing Hao
AU  - Yue Xiao
PY  - 2018
DO  - 10.1063/1.5078951
UR  - https://arxiv.org/abs/1810.12248
ID  - 1810.12248
ER  -