TY  - RPRT
TI  - Machine Learning Characterization of Structural Defects in Amorphous Packings of Dimers and Ellipses
AU  - Matt Harrington
AU  - Andrea J. Liu
AU  - Douglas J. Durian
PY  - 2019
DO  - 10.1103/physreve.99.022903
UR  - https://arxiv.org/abs/1811.03690
ID  - 1811.03690
ER  -