@misc{indiciae63f7015e6b07,
  title = {Benchmarking Gate Fidelities in a Si/SiGe Two-Qubit Device},
  author = {X. Xue and T. F. Watson and J. Helsen and D. R. Ward and D. E. Savage and M. G. Lagally and S. N. Coppersmith and M. A. Eriksson and S. Wehner and L. M. K. Vandersypen},
  year = {2018},
  doi = {10.1103/physrevx.9.021011},
  url = {https://arxiv.org/abs/1811.04002},
  note = {Source identifier: 1811.04002}
}