TY  - RPRT
TI  - Multifrequency Nanoscale Impedance Microscopy (m-NIM): A novel approach towards detection of selective and subtle modifications on the surface of polycrystalline boron-doped diamond electrodes
AU  - Artur Zielinski
AU  - Mateusz Cieslik
AU  - Michal Sobaszek
AU  - Robert Bogdanowicz
AU  - Kazimierz Darowicki
AU  - Jacek Ryl
PY  - 2018
UR  - https://arxiv.org/abs/1811.05709
ID  - 1811.05709
ER  -