@misc{indiciae5c4cad341c02,
  title = {Best of Both Worlds: Integration of Split Manufacturing and Camouflaging into a Security-Driven CAD Flow for 3D ICs},
  author = {Satwik Patnaik and Mohammed Ashraf and Ozgur Sinanoglu and Johann Knechtel},
  year = {2018},
  doi = {10.1145/3240765.3240784},
  url = {https://arxiv.org/abs/1811.06822},
  note = {Source identifier: 1811.06822}
}