TY  - RPRT
TI  - Best of Both Worlds: Integration of Split Manufacturing and Camouflaging into a Security-Driven CAD Flow for 3D ICs
AU  - Satwik Patnaik
AU  - Mohammed Ashraf
AU  - Ozgur Sinanoglu
AU  - Johann Knechtel
PY  - 2018
DO  - 10.1145/3240765.3240784
UR  - https://arxiv.org/abs/1811.06822
ID  - 1811.06822
ER  -