TY  - RPRT
TI  - Effect of AlN Seed Layer on Crystallographic Characterization of Piezoelectric AlN
AU  - Kaitlin M. Howell
AU  - Waqas Bashir
AU  - Annalisa de Pastina
AU  - Ramin Matloub
AU  - Paul Muralt
AU  - Luis G. Villanueva
PY  - 2018
UR  - https://arxiv.org/abs/1811.09156
ID  - 1811.09156
ER  -