TY  - RPRT
TI  - MOSFET Characterization and Modeling at Cryogenic Temperatures
AU  - Chao Luo
AU  - Zhen Li
AU  - TengTeng Lu
AU  - Jun Xu
AU  - GuoPing Guo
PY  - 2018
DO  - 10.1016/j.cryogenics.2018.12.009
UR  - https://arxiv.org/abs/1811.09987
ID  - 1811.09987
ER  -