TY  - RPRT
TI  - Compact Modeling of I-V Characteristics, Temperature Dependency, Variations, and Noise of Integrated, Reproducible Metal-Oxide Memristors
AU  - H. Nili
AU  - A. Vincent
AU  - M. Prezioso
AU  - M. R. Mahmoodi
AU  - I. Kataeva
AU  - D. Strukov
PY  - 2018
UR  - https://arxiv.org/abs/1811.10385
ID  - 1811.10385
ER  -