TY  - RPRT
TI  - Characterization and Modeling of 0.18μm CMOS Technology at sub-Kelvin Temperature
AU  - Tengteng Lu
AU  - Zhen Li
AU  - Chao Luo
AU  - Jun Xu
AU  - Weicheng Kong
AU  - Guoping Guo
PY  - 2018
UR  - https://arxiv.org/abs/1811.12632
ID  - 1811.12632
ER  -