@misc{indiciae77d89e7a35ef,
  title = {On the extraction of resistivity and area of nanoscale interconnect lines by temperature-dependent resistance measurements},
  author = {Christoph Adelmann},
  year = {2018},
  doi = {10.1016/j.sse.2018.12.005},
  url = {https://arxiv.org/abs/1812.01379},
  note = {Source identifier: 1812.01379}
}