TY  - RPRT
TI  - On the extraction of resistivity and area of nanoscale interconnect lines by temperature-dependent resistance measurements
AU  - Christoph Adelmann
PY  - 2018
DO  - 10.1016/j.sse.2018.12.005
UR  - https://arxiv.org/abs/1812.01379
ID  - 1812.01379
ER  -