@misc{indiciaecd9d640d6763,
  title = {Optical image-based thickness characterization of atomically thin nanomaterials using computer vision techniques},
  author = {Daniel Cui and Tom Goldstein and Jun Yan},
  year = {2018},
  url = {https://arxiv.org/abs/1812.03198},
  note = {Source identifier: 1812.03198}
}