TY  - RPRT
TI  - Multiple Parameter Dynamic Photoresponse Microscopy for data-intensive optoelectronic measurements of van der Waals heterostructures
AU  - Trevor B. Arp
AU  - Nathaniel M. Gabor
PY  - 2018
DO  - 10.1063/1.5085007
UR  - https://arxiv.org/abs/1812.03232
ID  - 1812.03232
ER  -