@misc{indiciaeeb399988744f,
  title = {Measuring thickness in thin NbN films for superconducting devices},
  author = {Owen Medeiros and Marco Colangelo and Ilya Charaev and Karl K Berggren},
  year = {2019},
  url = {https://arxiv.org/abs/1812.05559},
  note = {Source identifier: 1812.05559}
}