TY  - RPRT
TI  - Measuring thickness in thin NbN films for superconducting devices
AU  - Owen Medeiros
AU  - Marco Colangelo
AU  - Ilya Charaev
AU  - Karl K Berggren
PY  - 2019
UR  - https://arxiv.org/abs/1812.05559
ID  - 1812.05559
ER  -