TY  - RPRT
TI  - Effects of layer stacking and strain on electronic transport in 2D tin monoxide
AU  - Yanfeng Ge
AU  - Yong Liu
PY  - 2018
DO  - 10.1088/1674-1056/28/7/077104
UR  - https://arxiv.org/abs/1812.07301
ID  - 1812.07301
ER  -