@misc{indiciae3b043162782e,
  title = {X-ray tools for van der Waals epitaxy of bismuth telluride topological insulator films},
  author = {Stefan Kycia and Sergio L. Morelhao and Samuel Netzke and Celso I. Fornari and Paulo H. O. Rappl and Eduardo Abramof},
  year = {2018},
  url = {https://arxiv.org/abs/1812.10804},
  note = {Source identifier: 1812.10804}
}