@misc{indiciae53e6df959b42,
  title = {Correlating 3D atomic defects and electronic properties of 2D materials with picometer precision},
  author = {Xuezeng Tian and Dennis S. Kim and Shize Yang and Christopher J. Ciccarino and Yongji Gong and Yongsoo Yang and Yao Yang and Blake Duschatko and Yakun Yuan and Pulickel M. Ajayan and Juan-Carlos Idrobo and Prineha Narang and Jianwei Miao},
  year = {2019},
  url = {https://arxiv.org/abs/1901.00633},
  note = {Source identifier: 1901.00633}
}