TY  - RPRT
TI  - Novel method to study strain effect of thin films using a piezoelectric-based device and a flexible metallic substrate
AU  - Kazumasa Iida
AU  - Yuwa Sugimoto
AU  - Takafumi Hatano
AU  - Takahiro Urata
AU  - Marco Langer
AU  - Bernhard Holzapfel
AU  - Jens Hänisch
AU  - Hiroshi Ikuta
PY  - 2019
DO  - 10.7567/1882-0786/aaf6e6
UR  - https://arxiv.org/abs/1901.01478
ID  - 1901.01478
ER  -