TY  - RPRT
TI  - Robust 3D Surface Recovery by Applying a Focus Criterion in White Light Scanning Interference Microscopy
AU  - Hernando Altamar-Mercado
AU  - Alberto Patiño-Vanegas
AU  - Andres G Marrugo
PY  - 2019
DO  - 10.1364/ao.58.00a101
UR  - https://arxiv.org/abs/1901.08153
ID  - 1901.08153
ER  -