@misc{indiciaefb509ab886b0,
  title = {Dual mode microwave deflection cavities for ultrafast electron microscopy},
  author = {J. F. M. van Rens and W. Verhoeven and E. R. Kieft and P. H. A. Mutsaers and O. J. Luiten},
  year = {2019},
  doi = {10.1063/1.5049806},
  url = {https://arxiv.org/abs/1901.09579},
  note = {Source identifier: 1901.09579}
}