@misc{indiciae456e073ee142,
  title = {Reduced damage in electron microscopy by using interaction-free measurement and conditional re-illumination},
  author = {Akshay Agarwal and Karl K. Berggren and Vivek Goyal},
  year = {2019},
  doi = {10.1103/physreva.99.063809},
  url = {https://arxiv.org/abs/1901.09702},
  note = {Source identifier: 1901.09702}
}