TY  - RPRT
TI  - Reduced damage in electron microscopy by using interaction-free measurement and conditional re-illumination
AU  - Akshay Agarwal
AU  - Karl K. Berggren
AU  - Vivek Goyal
PY  - 2019
DO  - 10.1103/physreva.99.063809
UR  - https://arxiv.org/abs/1901.09702
ID  - 1901.09702
ER  -