TY  - RPRT
TI  - Modelling functional properties of ferroelectric oxide thin films with a three-domain structure
AU  - E. P. Houwman
AU  - K. Vergeer
AU  - G. Koster
AU  - G. Rijnders
PY  - 2019
UR  - https://arxiv.org/abs/1901.10883
ID  - 1901.10883
ER  -