@misc{indiciae0bd9403422e0,
  title = {Resolution enhancement in scanning electron microscopy using deep learning},
  author = {Kevin de Haan and Zachary S. Ballard and Yair Rivenson and Yichen Wu and Aydogan Ozcan},
  year = {2019},
  doi = {10.1038/s41598-019-48444-2},
  url = {https://arxiv.org/abs/1901.11094},
  note = {Source identifier: 1901.11094}
}