@misc{indiciaeead4c804d6ae,
  title = {Direct Measurement of the Electron Beam Intensity Profile via Carbon Nanotube Tomography},
  author = {Matthew Zotta and Sharadh Jois and Prathamesh Dhakras and Miguel Rodriguez and Ji Ung Lee},
  year = {2019},
  doi = {10.1021/acs.nanolett.9b01228},
  url = {https://arxiv.org/abs/1902.02735},
  note = {Source identifier: 1902.02735}
}