TY  - RPRT
TI  - Static and Dynamic Oxide-Trapped-Charge-Induced Variability in Nanoscale CMOS Circuits
AU  - Gennady Zebrev
PY  - 2019
DO  - 10.1109/ted.2019.2907816
UR  - https://arxiv.org/abs/1902.04974
ID  - 1902.04974
ER  -