TY  - RPRT
TI  - Epitaxial Integration on Si(001) of Ferroelectric Hf0.5Zr0.5O2 Capacitors with High Retention and Endurance
AU  - Jike Lyu
AU  - Ignasi Fina
AU  - Josep Fontcuberta
AU  - Florencio Sánchez
PY  - 2019
DO  - 10.1021/acsami.8b18762
UR  - https://arxiv.org/abs/1902.05504
ID  - 1902.05504
ER  -