@misc{indiciae830734a89cfc,
  title = {The atomic lensing model: new opportunities for atom-by-atom metrology of heterogeneous nanomaterials},
  author = {K. H. W. van den Bos and L. Janssens and A. De Backer and P. D. Nellist and S. Van Aert},
  year = {2019},
  doi = {10.1016/j.ultramic.2018.12.004},
  url = {https://arxiv.org/abs/1902.05806},
  note = {Source identifier: 1902.05806}
}