@misc{indiciae6ddd2a118384,
  title = {New techniques for imaging and identifying defects in electron microscopy},
  author = {Daniel S. Gianola and T. Ben Britton and Stefan Zaefferer},
  year = {2019},
  url = {https://arxiv.org/abs/1902.06909},
  note = {Source identifier: 1902.06909}
}