TY  - RPRT
TI  - Scaling properties of noise-induced switching in a bistable tunnel diode circuit
AU  - Stephen W. Teitsworth
AU  - Matthew E. Olson
AU  - Yuriy Bomze
PY  - 2019
DO  - 10.1140/epjb/e2019-90711-0
UR  - https://arxiv.org/abs/1902.08711
ID  - 1902.08711
ER  -