@misc{indiciaea67921bc439b,
  title = {Extreme defect sensitivity from large synthetic dimensionality},
  author = {Lukas J. Maczewsky and Kai Wang and Alexander A. Dovgiy and Andrey E. Miroshnichenko and Alexander Moroz and Max Ehrhardt and Matthias Heinrich and Demetrios N. Christodoulides and Alexander Szameit and Andrey A. Sukhorukov},
  year = {2019},
  doi = {10.1038/s41566-019-0562-8},
  url = {https://arxiv.org/abs/1903.07883},
  note = {Source identifier: 1903.07883}
}