@misc{indiciae06788d264ab7,
  title = {Temperature-dependent Fowler-Nordheim electron barrier height in SiO2/4H-SiC MOS capacitors},
  author = {Patrick Fiorenza and Marilena Vivona and Ferdinando Iucolano and Andrea Severino and Simona Lorenti and Giuseppe Nicotra and Corrado Bongiorno and Filippo Giannazzo and Fabrizio Roccaforte},
  year = {2021},
  doi = {10.1016/j.mssp.2017.11.024},
  url = {https://arxiv.org/abs/1903.08572},
  note = {Source identifier: 1903.08572}
}