@misc{indiciae7570f71cf263,
  title = {Nitrogen Contamination Causes High Field Q-Slope (HFQS) in Buffered Chemical Polished SRF Cavities},
  author = {D. Luo and K. Saito and S. Shanab},
  year = {2019},
  url = {https://arxiv.org/abs/1904.00145},
  note = {Source identifier: 1904.00145}
}