@misc{indiciaeae701210b188,
  title = {High-temperature deep-level transient spectroscopy system for defect studies in wide-bandgap semiconductors},
  author = {S. Majdi and M. Gabrysch and N. Suntornwipat and F. Burmeister and R. Jonsson and K. K. Kovi and A. Hallen},
  year = {2019},
  doi = {10.1063/1.5097755},
  url = {https://arxiv.org/abs/1904.02589},
  note = {Source identifier: 1904.02589}
}