TY  - RPRT
TI  - High-temperature deep-level transient spectroscopy system for defect studies in wide-bandgap semiconductors
AU  - S. Majdi
AU  - M. Gabrysch
AU  - N. Suntornwipat
AU  - F. Burmeister
AU  - R. Jonsson
AU  - K. K. Kovi
AU  - A. Hallen
PY  - 2019
DO  - 10.1063/1.5097755
UR  - https://arxiv.org/abs/1904.02589
ID  - 1904.02589
ER  -