TY  - RPRT
TI  - Pattern Matching Analysis of Electron Backscatter Diffraction Patterns for Pattern Centre, Crystal Orientation and Absolute Elastic Strain Determination: Accuracy and Precision Assessment
AU  - Tomohito Tanaka
AU  - Angus J. Wilkinson
PY  - 2019
UR  - https://arxiv.org/abs/1904.06891
ID  - 1904.06891
ER  -