TY  - RPRT
TI  - Fluxon-induced losses in niobium thin-film cavities revisited
AU  - Wolfgang Weingarten
PY  - 2020
DO  - 10.1109/tasc.2020.2998941
UR  - https://arxiv.org/abs/1904.07160
ID  - 1904.07160
ER  -