@misc{indiciae81d86c6edae3,
  title = {Dielectric properties of strained NiO thin films},
  author = {Alireza Kashir and Hyeon-Woo Jeong and Gil-ho Lee and Pavlo Mikheenko and Yoon Hee Jeong},
  year = {2019},
  doi = {10.3938/jkps.74.984},
  url = {https://arxiv.org/abs/1904.07564},
  note = {Source identifier: 1904.07564}
}