TY  - RPRT
TI  - Dielectric properties of strained NiO thin films
AU  - Alireza Kashir
AU  - Hyeon-Woo Jeong
AU  - Gil-ho Lee
AU  - Pavlo Mikheenko
AU  - Yoon Hee Jeong
PY  - 2019
DO  - 10.3938/jkps.74.984
UR  - https://arxiv.org/abs/1904.07564
ID  - 1904.07564
ER  -