TY  - RPRT
TI  - Anomalous conduction band fluctuation in silicon carbide metal-oxide-semiconductor structures revealed by electrical characterization of field effect transistors combined with self-consistent numerical calculations
AU  - Koji Ito
AU  - Takuma Kobayashi
AU  - Tsunenobu Kimoto
PY  - 2019
DO  - 10.1063/5.0013240
UR  - https://arxiv.org/abs/1904.08574
ID  - 1904.08574
ER  -