TY  - RPRT
TI  - The role of ionization fraction on the surface roughness, density and interface mixing of the films deposited by thermal evaporation, dc magnetron sputtering and HiPIMS: An atomistic simulation
AU  - Movaffaq Kateb
AU  - Hamidreza Hajihoseini
AU  - Jon Tomas Gudmundsson
AU  - Snorri Ingvarsson
PY  - 2019
UR  - https://arxiv.org/abs/1904.08758
ID  - 1904.08758
ER  -