TY  - RPRT
TI  - Oxidized silicon sulfide: stability and electronic properties of a novel two-dimensional material
AU  - Zhengnan Li
AU  - Shuai Dong
AU  - Jie Guan
PY  - 2019
UR  - https://arxiv.org/abs/1904.09614
ID  - 1904.09614
ER  -